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Maury Presentations
Technical and informational presentations by Maury experts, covering Maury product and related microwave and RF/test and measurement industry applications

Technical Presentations Archives

2010

An Introduction To Gallium Nitride (GaN) Device Characterization
Presented by Steve Dudkiewicz - Maury Microwave Corporation
Presesnted at the IMS2010 Exhibition as one of the Microwave Application Seminars.
26 May 2010
Download This Presentation (Powerpoint Slideshow - 6.13 MB)

High Power Load Pull with X-Parameters - A New Paradigm for Modeling and Design;
Presented by Gary Simpson - Maury Microwave Corporation
Presesnted at the IMS2010 Exhibition as one of the Microwave Application Seminars.
26 May 2010
Download This Presentation (PDF from the Powerpoint Slideshow - 2.1 MB)

Mobile Phone Testing Using Impedance Tuner
Presented by Roman Meierer and Steve Dudkiewicz - Maury Microwave Corporation
Presesnted at the IMS2010 Exhibition as one of the Microwave Application Seminars.
27 May 2010
Download This Presentation (Powerpoint Slideshow - 2.7 MB)

Ultra-Fast Noise Parameter Measurements - 100x Faster and More Accurate
Presented by Gary Simpson - Maury Microwave Corporation
First presesnted at the IMS2010 Exhibition as one of the Microwave Application Seminars.
27 May 2010
Download This Presentation (PDF from the Powerpoint Slideshow - 304 KB)

Coaxial Measurements - Common Mistakes and Simple Solutions
Presented by Sathy Padmanabhan and Rocky Teresa - Maury Microwave Corporation
Presesnted at the IMS2010 Exhibition as one of the Microwave Application Seminars.
27 May 2010
Download This Presentation (Powerpoint Slideshow - 5.9 MB)

2009

Connectors - Precision or Not?
Presented by Sathy Padmanabhan - Maury Microwave Corporation
First presesnted at the IMS2009 Exhibition as one of the Microwave Application Seminars.
07 June 2009
Download This Presentation (Powerpoint Slideshow - 9.4 MB)

Click Here to view this Presentation with Audio from the IMS2009 Microwave Applications Seminar

Load Pull with X-Parameters - A New Paradigm for Modeling and Design
Presented by Gary Simpson - Maury Microwave Corporation
First presesnted at the IMS2009 Exhibition as one of the Microwave Application Seminars.
08 June 2009
Download This Presentation ( PDF document - 509.8 KB)

Click Here to view this Presentation with Audio from the IMS2009 Microwave Applications Seminar

Ultra-Fast Noise Parameter Measurements More than 100x Faster Enhanced Accuracy
Presented by Gary Simpson - Maury Microwave Corporation
First presesnted at the IMS2009 Exhibition as one of the Microwave Application Seminars.
08 June 2009
Download This Presentation ( PDF document - 222.7 KB)

Multi-Frequency Tuning Using Cascaded Mechanical Tuners
Presented by Roman Meierer and Gary Simpson - Maury Microwave Corporation
First presesnted at the IMS2009 Exhibition as one of the Microwave Application Seminars.
08 June 2009
Download This Presentation (Powerpoint Slideshow - 1.4 MB)

Click Here to view this Presentation with Audio from the IMS2009 Microwave Applications Seminar

Primary Noise Calibration Systems (DC-110 GHz) - Accuracy and Advantages
Presented by Sathy Padmanabhan - Maury Microwave Corporation
First presesnted at the IMS2009 Exhibition as one of the Microwave Application Seminars.
08 June 2009
Download This Presentation (Powerpoint Slideshow - 422 KB)

Click Here to view this Presentation with Audio from the IMS2009 Microwave Applications Seminar

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