Home < RFDCS Products < MT900N Characterization System Integration MT900N Characterization System Integration Features Description Maury's mission is to meet its customers device characterization needs regardless of the level of complexity. Maury has and continues to provide solutions covering the entire measurement spectrum; from the simplest stand-alone tuner to fully integrated turnkey systems. Maury will integrate these features into an easily assembled and calibrated system that is straightforward to use, saving time as well as money. Furthermore, the results will display greater accuracy and repeatability. Less time and less money means a more profitable design cycle. In-situ Calibration The power of a Maury integrated system begins with its proprietary in-situ calibration method, which allows for a complete system-level calibration without disconnecting any of the core system components. The majority of calibration and measurement errors occur for the following reasons; multiple VNA calibrations with improper reference-plane shifting, probes that are connected/disconnected multiple times or measured on their own, and multiple small measurement errors that cascade into very large errors. Unlike the above situations, in-situ calibration requires only one single connection, makes use of highly-repeatable and reliable RF switches and automates the calibration procedure through the use of a graphic wizard. Overall system level verification procedures built into the ATS software result in average deltaGT values of less than 0.2dB at all magnitudes and phases, when performing an in-situ calibration. Turnkey Measurement Systems Maury works very closely with instrument and component manufacturers to offer complete turnkey noise parameters as well as large-signal test systems for both on-wafer and packaged device measurements. Recognized as the global leader in microwave and millimeter-wave tuners and DC systems, Maury has partnered with numerous multinational companies who are also leaders in their respective fields. Examples include Agilent Technologies for RF Instruments (Network Analyzers, Spectrum Analyzers, Power meters, Power supplies), Cascade Microtech (on-wafer probe stations, probes and positioners), Intercontinental Microwave (test fixtures and jigs), Quantum Focus Instruments (Thermal IR cameras), Auriga Measurement Systems (Pulsed IV), as well as component and cabling manufacturers. Turnkey measurement systems are available for sign-off and acceptance at Maurys corporate office. MT900N15 Integrated Load Pull and Noise Measurement System The MT900N15 system (pictured above) offers an excellent example of Maury's integration efforts. MT900N15 is a 60-90 GHz turnkey Device Characterization System fully integrated for on-wafer s-parameter, noise parameter, and large-signal power measurements, mounted on a Cascade Microtech S300 automated probe station. It is fully automated through GPIB and LAN communication, and includes a millimeter-wave Agilent PNA network analyzer, spectrum analyzer, power meter, and noise figure analyzer in conjunction with a Maury Microwave MT7553M15 noise receiver module, two Maury MT978A 60-90 GHz automated tuners and MT993 ATS software. Specific customer needs and specifications can be addressed through customization. Further information is available from our Sales Department.
Fully Integrated Coaxial and Millimeter-Wave Device Characterization Systems, 250 MHz to 110 GHz
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Power and noise parameter measurements
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Packaged and On-Wafer measurements
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Modulated, pulsed and CW signals
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Automated in-situ calibration
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Fewer connections
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Reliable and fast RF switching
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Saves time and money
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Turnkey systems available - Works out of the box
Integrated systems are offered between 250 MHz and 110 GHz, in-fixture and on-wafer, and are capable of measuring the following:
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S-Parameters
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X-Parameters
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DC-IV and Pulsed-IV measurements
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Power Measurements: Pout, Pin-delivered, Gain, Compression, Efficiency, Harmonic Powers
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Multi-Tone Measurements: IMD, TOI
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Modulated Measurements: ACPR, EVM, CCDF
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Noise Parameters: NFmin, Γopt, Rn, Noise and Gain contours
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Time-domain Analysis: A-B waves, I-V waves, load lines
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Thermal Microscopic load pull
Application Note 5A-039
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