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Advanced Characterization Systems A Showcase of Maury Systems Integration Know-How
Over the years, Maury has produced some of the most advanced and sophisticated RF & microwave device characterization systems in the world. Our team of expert engineers and technicians have an unrivaled pool of knowledge, skill, and experience in combining diverse test and measurement instruments, components and auxiliary equipment into completely integrated, turnkey systems. We work closely with our customers to determine the best solutions for their specific applications and can bring all of the necessary system components together, set up the test bench, verify that everything works as it should, then deliver and install it on-site, and hand it over ready to begin operation. Combine that with Maury's outstanding after sale technical support, and calibration and repair services, and you have the right team on your side. On this page we showcase one of the advanced systems that have earned us our reputation as the best in the industry. Millimeter-Wave Device Characterization Systems Fully Integrated by Maury Engineers, 250 MHz to 110 GHz Features Power, noise parameter, and intermod measurements Packaged and on-wafer measurements Modulated, pulsed and CW signals Automated in-situ calibration Fewer connections Reliable and fast RF switching Saves time and money Turnkey systems available for coaxial and waveguide 24mm Load Pull Device Characterization System Integration Fully Integrated by Maury Engineers, 8 to 50 GHz Features Complete s-parameter, noise parameter, and x-parameter measurements Packaged and on-wafer measurements Automated in-situ calibration Fewer connections Reliable and fast RF switching Saves time and money Turnkey systems available Real-time IR Load Pull Systems for PA and High-power Transistor Design Fully Integrated by Maury Engineers Features Real-time thermal analysis versus source and load impedance, frequency, and bias Thermal resistance, non-uniform V-I, and current measurements Packaged device measurements Optimization of die layout and ballast for: Improved effective power density Improved PAE, gain, and linearity Improved ruggedness Specific customer needs and specifications can be addressed through customization. Further information is available from our Sales Department. Application Note 5A-039 (333 KB)	Click On These Images For More Information or Large Views. MT900N15 Fully Integrated Millimeter-Wave Noise Parameter, Power and Intermod Measurement System. MT900N Series Fully Integrated 2.4mm 50 GHz Load Pull Measurement System, for complete S-Parameters, Noise Parameter, and X-Parameter measurements. MT900N Series Fully Integrated Real-Time IR Load Pull System.
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